Research Abstract



Direct imaging of Joule heating dynamics and temperature profiling inside a nanotube interconnect

2011年8月9日 Nature Communications 2 : 421 doi: 10.1038/ncomms1429


Pedro M.F.J. Costa1,2, Ujjal K. Gautam3*, 板東 義雄3 & Dmitri Golberg3

  1. アヴェイロ大学(ポルトガル)
  2. ドレスデン・ライプニッツ固体・加工材料研究所(ドイツ)
  3. 独立行政法人 物質・材料研究機構 国際ナノアーキテクトニクス研究拠点
Understanding resistive (or Joule) heating in fundamental nanoelectronic blocks, such as carbon nanotubes, remains a major challenge, particularly in regard to their structural and thermal variations during prolonged periods of electrical stress. Here we show real-time imaging of the associated effects of Joule heating in the channel of carbon nanotube interconnects. First, electrical contacts to nanotubes entirely filled with a sublimable material are made inside a transmission electron microscope. On exposure to a high current density, resistive hotspots are identified on (or near) the contact points. These later migrate and expand along the carbon nanotube, as indicated by the localized sublimation of the encapsulated material. Using the hotspot edges as markers, it is possible to estimate the internal temperature profiles of the nanotube. Simple and direct, our method provides remarkable spatial and temporal insights into the dynamics of resistive hotspots and millisecond-paced thermal variations occurring inside nanoscaled tubular interconnects.